Abstract
We grew Cd1−xMnx Te crystals with a nominal Mn concentration of 5% by the vertical Bridgman growth technique. The structural quality of the crystal was evaluated by white beam X-ray topography in the National Synchrotron Light Source (NSLS) facility at Brookhaven National Laboratory (BNL). We observed that the crystal was free from a sub-grain boundary network, as revealed by X-ray topography and verified by our etching study. The concentration of the secondary phases, averaged over the entire ingot, was 2–3 times lower than in conventional Bridgman grown cadmium zinc telluride (CZT) crystals.
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