Abstract
In this work we explore mechanical properties of graphene samples of variable thickness. For this purpose, we coupled a high pressure sapphire anvil cell to a microRaman spectrometer. From the evolution of the G band frequency with stress, we document the importance the substrate has on the mechanical response of graphene. On the other hand, the appearance of disorder as a consequence of the stress treatment has a negligible effect on the high stress behavior of graphene.Isotopic labeled twisted bilayer graphene under compression characterized by Raman spectroscopy.
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