Abstract
Conductive mode imaging of sintered zinc oxide has been carried out in the SEM using the remote electron beam induced current mode. The use of this technique enables the electrical effects of built-in fields and resistive barriers in the material to be imaged in the microstructure. Two contrast types were observed at grain boundaries where such fields or barriers were active; parallel bright and dark lines, or single bright/dark lines. Possible structures giving rise to these contrast effects are discussed.
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