Abstract
The composition of the grain boundaries in hot-pressed polycrystalline samples of CoO containing varying levels of indium as a dopant has been investigated using Auger electron spectroscopy and X-ray photoelectron spectroscopy. Segregation of the indium to the grain boundaries has been observed and both the boundary enrichment level and the depth of the segregated layer have been found to vary as functions of additive concentration, annealing temperature and quenching rate. Models based on the existence of space charges or on strain energy terms are both unsatisfactory for the interpretation of the data obtained; it is believed that a contribution to segregation from non-equilibrium processes occurring during cooling must be present.
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