Abstract
Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS), and electron microprobe analysis (EMA) were applied to investigate the chemical composition, impurities, and the homogeneity of thin para- and ferroelectric epitaxial KTa1−xNbxO3 (KTN) layers grown by liquid-phase epitaxy using a KTN-KF flux. AES indicated no Ta/Nb fluctuations within the layer plane and in the growth direction. XPS and EMA determined a F incorporation of 0.8–0.9 mol % for as-grown and 0.6 mol % for annealed samples. Valence analyses with XPS and electron paramagnetic resonance (EPR) revealed only the regular valence state for the B atoms of a (I,V)ABO3 perovskite lattice. An unexpected splitting of the K 2p doublet peak was found for as-grown layers. Structural defects observed by optical microscopy and x-ray topography were attributed to lattice relaxation effects. Optical waveguiding could be achieved for para- and ferroelectric layers.
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