Abstract
A method using a double-tilt goniometer stage for determining the orientation of crystalline specimens in transmission electron microscopy (TEM) is described. The procedure involves visual identification of two zone axes, and using the corresponding goniometer settings to plot these poles stereographically. Crystal orientations and misorientations can be established rapidly, and the method is intended for use as a practical complement to more precise but time-consuming techniques. The commutative operation of double-tilt stages and their goniometric capability are also discussed. Using Rodrigues-Frank space, it is shown that the set of attainable operations for such stages is represented by points on an hyperboloidal surface.
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