Abstract
Angular and energy distributions of dissociated fragments resulting from glancing angle incidence of MeV H 2 + ions on clean (001) surfaces of SnTe single crystals in UHV are studied. The distributions are compared with those obtained for H + projectiles of the same velocity. It is shown that the molecular axis of H 2 + or vector connecting its fragments tends to align to the surface during reflection at the surface. This alignment is qualitatively explained in terms of surface planar potential.
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