Abstract
BackgroundIdentifying the loci and dissecting the genetic architecture underlying wheat yield- and quality-related traits are essential for wheat breeding. A genome-wide association study was conducted using a high-density 90 K SNP array to analyze the yield- and quality-related traits of 543 bread wheat varieties.ResultsA total of 11,140 polymorphic SNPs were distributed on 21 chromosomes, including 270 significant SNPs associated with 25 yield- and quality-related traits. Additionally, 638 putative candidate genes were detected near the significant SNPs based on BLUP data, including three (TraesCS7A01G482000, TraesCS4B01G343700, and TraesCS6B01G295400) related to spikelet number per spike, diameter of the first internode, and grain volume. The three candidate genes were further analyzed using stage- and tissue- specific gene expression data derived from an RNA-seq analysis. These genes are promising candidates for enhancing yield- and quality-related traits in wheat.ConclusionsThe results of this study provide a new insight to understand the genetic basis of wheat yield and quality. Furthermore, the markers detected in this study may be applicable for marker-assisted selection in wheat breeding programs.
Highlights
Identifying the loci and dissecting the genetic architecture underlying wheat yield- and qualityrelated traits are essential for wheat breeding
The limited genetic diversity of bread wheat has resulted in breeding bottlenecks, and the application of traditional breeding methods has led to gradual increases in wheat yield and quality [3]
The aim of this study was to identify the stable loci and candidate genes significantly associated with wheat yield and quality
Summary
Identifying the loci and dissecting the genetic architecture underlying wheat yield- and qualityrelated traits are essential for wheat breeding. A genome-wide association study was conducted using a highdensity 90 K SNP array to analyze the yield- and quality-related traits of 543 bread wheat varieties. The limited genetic diversity of bread wheat has resulted in breeding bottlenecks, and the application of traditional breeding methods has led to gradual increases in wheat yield and quality [3]. Several SNP arrays (e.g., 9 K, 35 K, 90 K, 660 K, and 820 K) have recently been developed They have been used to analyze bi-parental populations and identify loci (QTLs) controlling yield- and qualityrelated traits [5,6,7,8,9]. Traditional QTL mapping methods are usually based on specific characteristics of parental populations, and are time-consuming and laborious [10]
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