Abstract
In this paper, we consider a modified shifting bottleneck heuristic for complex job shops. The considered job shop environment contains parallel batching machines, machines with sequence-dependent setup times and reentrant process flows. Semiconductor wafer fabrication facilities (Wafer Fabs) are typical examples for manufacturing systems with these characteristics. Our primary performance measure is total weighted tardiness (TWT). The shifting bottleneck heuristic uses a disjunctive graph to decompose the overall scheduling into scheduling problems for single tool groups. The scheduling algorithms for these scheduling problems are called subproblem solution procedures (SSPs). In previous research, only subproblem solution procedures based on dispatching rules have been considered. In this paper, we are interested in how much we can gain in terms of TWT if we apply more sophisticated subproblem solution procedures like genetic algorithms for parallel machine scheduling. We conduct simulation experiments in a dynamic job shop environment in order to assess the performance of the suggested subproblem solution procedures. It turns out that using near to optimal subproblem solution procedures leads in many situations to improved results compared to dispatching-based subproblem solution procedures.
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