Abstract
Properties of the characteristic X-ray radiation excited in quartz under 100-keV proton bombardment have been experimentally investigated. The measured intensity of SiKα radiation for quartz is higher than that for pure silicon by three orders of magnitude. An afterglow from the target is observed for hundreds of seconds after the ion beam is turned off. This enhanced radiation intensity and the afterglow duration have been measured as a function of the beam current, beam grazing angle, and pressure in the chamber. The measurement data indicate that the enhanced insulator radiation is caused by the accumulation and discharge of a positive charge formed in a dielectric and on its surface under exposure to an ion beam.
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Schedule a callMore From: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
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