Abstract

Efficient and early verification of the chip power distribution network is a critical step in modern chip design. Vectorless verification, developed over the last decade as an alternative to simulation-based methods, requires user-specified current constraints (budgets) and checks if the corresponding worst-case voltage drops at all grid nodes are below user-specified thresholds. However, obtaining/specifying the current constraints remains a burdensome task for users. In this paper, we define and address the inverse problem: for a given grid, we would like to generate circuit current constraints which, if adhered to by the underlying logic, would guarantee grid safety. There are many potential applications for this approach, including various grid quality metrics, as well as voltage drop aware placement and floorplanning. We give a rigorous problem definition and develop some key theoretical results related to maximality of the current space defined by the constraints. Based on this, we then develop two algorithms for constraints generation that target the peak total chip power that is allowed by the grid and the uniformity of the temperature distribution. Finally, we develop a superior algorithm which targets a combination of both quality metrics.

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