Gauge Length Effect on the Strength of Silicon Carbide and Sapphire Filaments

Abstract

A modification of the Weibull type of flaw distribution function has been suggested for analysing the strength distribution of sapphire and SiC on carbon filaments. The function provides an upper and lower strength limit and is characterised by two shape parameters. The strength distributions of sapphire and SiC filaments, reported by previous workers, were analysed in terms of the proposed distribution function. Strength distribu tion data obtained at greater lengths (254 mm) were used to predict strength distribution at shorter length of 75 mm. The predicted values were in close agreement with the ex perimental ones. The average strength values calculated down to a length of 12.5 mm also agreed with the experimental values quite well.