Abstract
This paper deals with automated test pattern generation for large synchronous sequential circuits and describes an approach based on genetic algorithms. A prototype system named GATTO is used to assess the effectiveness of the approach in terms of result quality and CPU time requirements. An account is also given of a distributed version of the same algorithm, named GATTO*. Being based on the PVM library, it runs on any network of workstations and is able to either reduce the required time, or improve the result quality with respect to the monoprocessor version. In the latter case, in terms of Fault Coverage, the results are the best ones reported in the literature for most of the largest standard benchmark circuits. The flexibility of GATTO enables users to easily tradeoff fault coverage and CPU time to suit their needs.
Published Version
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