Abstract
The progressive wear-out of a breakdown path in ultra-thin gate oxides depends on oxide thickness and follows the intrinsic voltage acceleration model of time to breakdown. The quantification of progressive wear-out in this work is the critical step towards product relevant assessment of ultra-thin gate oxides.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
