Abstract
HgTe/Hg0.3Cd0.7Te(0 0 1) quantum well structures fabricated with a Si–O–N insulator layer and an Au top gate electrode exhibit hysteresis effects in their gate-voltage dependent carrier density and thus a nonlinear variation of the Rashba spin–orbit splitting energy (ΔR). Charging and discharging of states at the semiconductor insulator interface has been found to be responsible for this effect. The quantitative agreement with a simple capacitor model has been used to identify the maximum hysteresis-free gate-voltage range. A nearly linear variation of ΔR with applied gate voltage has been observed in this range.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
