Abstract
Improved gain was observed at low currents when a thin emitter ledge was incorporated into npn In0.52Al0.48As/In0.53Ga0.47As heterojunction bipolar transistors. A 40-nm-thick n-In0.52Al0.48As emitter ledge resulted in over four times higher gain at low biases due to reduced surface recombination.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
