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Abstract
GaBiLi - A Novel Focused Ion Beam (FIB) Source for Ion Microscopy and Related Workflows for 3D Tomography with a Top-Down FIB From Liquid Metal Alloy Ion Sources (LMAIS).
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Schedule a callMore From: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
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