Abstract
Gulden et al. (pp. 2495-2498) performed a coherent diffraction experiment on single GaAs nanowires. For this experiment, the hard X-ray nanobeam scanning X-ray microscope at ID 13 of the European Synchrotron Radiation Facility (ESRF) was used. Diffraction patterns in the vicinity of a Bragg peak were measured locally in a small region of a selected nanowire, and the origin of the different features is explained. The cover image shows a 3D isosurface of the scattered intensity in the vicinity of the Bragg peak in reciprocal space combined of 60 diffraction patterns. With further development of the method, Coherent X-Ray Diffractive Imaging (CXDI) can possibly provide high resolution images of complicated nanowire structures.
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