From microns to kissing contact: Dynamic positioning of two nano-systems

Abstract

Two conducting atomic force microscopy probes are brought into three-dimensional nanoscale “tip-to-tip” alignment with dynamically controlled spacing and ultra-wide optical access. We utilize resonant electrical parametric mixing, created by the electromechanically coupled tips, to extract the electronic signal due to nanoscale changes in inter-tip position. Experimental results match theory confirming the viability of the technique. By functionalizing the tip apexes, this advanced multi-functional observation platform allows simultaneous measurement of the optical and electronic response of nanoparticle dimers, at sub-nanometer separations.