Abstract
The present study aims to provide a comprehensive analysis on thin film, ZrS:BaS:Ni9S8. ZrS:BaS:Ni9S8 thin film was fabricated in a resistive heating unit from a single source precursor. With 21 nm crystallite size for ternary metal sulfide through XRD, a 2.5 eV optical band gap was elucidated. The chemical composition was assessed by the X-ray photoelectron spectroscopy, which revealed core level peaks associated with Zr3d, S2p, Ba3d and Ni2p. A remarkable specific capacitance value of 540.7 F g−1 was assessed through cyclic voltammetry. This notable performance, coupled with the thin film's excellent cycling stability, established the thin film as a capable contender for diverse applications of energy retention. Moreover, a comprehensive investigation on the removal through photocatalysis of environmental pollutants; zoxamide, methylene blue, and phenol was done. The pesticide zoxamide depicted the degradation rate constant 3.9 × 10−2 min−1. The results present persuasive proof of the multifaceted opportunities presented by the ZrS:BaS:Ni9S8 thin film, outspreading its application outside energy retention to incorporate innovative functionalities.
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