Abstract
We report quantitative determination of elemental distribution in binary compounds with nano meter scale spatial resolution using x-ray Fresnel coherent diffractive imaging (FCDI). We show that the quantitative magnitude and phase values of the x-ray wave exiting an object determined by FCDI can be utilized to obtain full-field atomic density maps of each element independently. The proposed method was demonstrated by reconstructing the density maps of Pt and NiO in a Pt-NiO binary compound with about 18 nm spatial resolution.
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