Abstract

We have analyzed both theoretically and experimentally the spectrum of the optical pulses produced by the interaction of optical and THz pulses in a ZnTe crystal. Recorded as a function of the delay between the two pulses, the resulting spectrogram can be viewed as a frequency resolved cross-correlation between the optical and THz pulses making it possible to characterize the optical pulse.

Highlights

  • Nonlinear interaction of terahertz (THz) and ultrashort optical pulses in Zinc Blende crystals is widely used to perform electro-optic (EO) sampling of THz pulses [1, 2]: the THz pulse, due to the Pockels effect, induces a phase modulation of the optical pulse which is measured for different time delays τ between the two pulses

  • In these experiments performed in a 110 ZnTe crystal, the interaction of the THz wave, polarized along the 001 -axis, with the probe pulse, cross-polarized with respect to the latter, leads to sidebands which are superimposed to the spectrum of the incident optical pulse

  • Both intensity profiles are in good agreement except near the zeros of the THz wave, due to both the lack of phase sensitivity of our detection scheme and the convolution of the THz wave with a probe pulse intensity profile of finite duration

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Summary

Introduction

Nonlinear interaction of terahertz (THz) and ultrashort optical pulses in Zinc Blende crystals is widely used to perform electro-optic (EO) sampling of THz pulses [1, 2]: the THz pulse, due to the Pockels effect, induces a phase modulation of the optical pulse which is measured for different time delays τ between the two pulses. According to Gallot and Grischkowsky [3], the spectrum of the optical pulse resulting from the interaction between the THz and optical fields in conventional EO sampling can be understood as the generation of phase-coherent sidebands, by sumand difference-frequency mixing (SFG-DFG), on the spectrum of the incident optical pulse. These sidebands can be regarded as the result of a Pockels-induced cross-phase modulation (XPM).

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