Abstract
The microstructural origins of the effect of frequency on the electrical fatigue behavior of pre-cracked soft ferroelectric Pb(Zr 0.48Ti 0.52)O 3 is investigated by means of a high spatial resolution hard X-ray synchrotron source. It is found that there is a strong link between the frequency of the applied bipolar field, domain-switching behavior in terms of ferroelastic reorientation of the domains around the crack tip and the resultant crack growth. The crack growth is accentuated under increased ferroelastic switching and, in particular, found to be more pronounced under low-frequency loading. The concept of domain wall viscoelasticity is applied to explain why lower frequencies accelerate crack growth under a bipolar electric field.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
