Abstract
Optical reflectivity studies on free-standing liquid crystal films above the bulk smectic temperature range have revealed different melting phenomena. Our measurements are performed on tilted smectic phases (smectic C*, smectic C) using optical microscopy in polarized light in order to visualize the changes of the film structure. We observe the formation of twodimensional defect structures from string-like lines in very thick (about 1000 layers) as well as in thin (about 20 layers) films. In thick films these structures nucleate around the temperature of the bulk smectic-cholesteric phase transition, while in thin films the formation of the defects occurs well above this temperature and just before the thinning transitions. In thick and intermediate thickness films, cholesteric or nematic droplets and a ‘quasi-smectic’ structure are observed. The films exhibiting the ‘quasi-smectic’ structure definitely exist at higher temperatures than the smectic films with the same thickness.
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