Abstract
On-detector digital electronics in High-Energy Physics experiments is increasingly being implemented by means of SRAM-based FPGA, due to their capabilities of reconfiguration, real-time processing and multi-gigabit data transfer. Radiation-induced single event upsets in the configuration hinder the correct operation, since they may alter the programmed routing paths and logic functions. In most trigger and data acquisition systems, data from several front-end modules are concentrated into a single board, which then transmits data to back-end electronics for acquisition and triggering. Since the front-end modules are identical, they host identical FPGAs, which are programmed with the same bitstream. In this work, we present a novel scrubber capable of correcting radiation-induced soft-errors in the configuration of SRAM-based FPGAs by majority voting across different modules. We show an application of this system to the read-out electronics of the Aerogel Ring Imaging CHerenkov (ARICH) subdetector of the Belle2 experiment at SuperKEKB of the KEK laboratory (Tsukuba, Japan). We discuss the architecture of the system and its implementation in a Virtex-5 LX50T FPGA, in the concentrator board, for correcting the configuration of up to six Spartan-6 LX45 FPGAs, on pertaining front-end modules. We discuss results from fault-injection and neutron irradiation tests at the TRIGA reactor of the Jozef Stefan Institute (Ljubljana, Slovenia) and we compare the performance of our solution to the Xilinx Soft Error Mitigation controller.
Highlights
O N-DETECTOR digital electronics in High-Energy Physics (HEP) experiments is increasingly being implemented by means of Static Random Access Memory-based (SRAM-based) Field Programmable Gate Arrays (FPGAs) [1]
We describe a scrubber implementation dedicated to data acquisitions systems and based on majority voting of configuration frames across clustered non-redundant modules
Boron has two naturally occurring and stable isotopes 10B (19.9%) and 11B (80.1%). 10B has a relatively high cross-section (3.8 kbarns) for thermal neutron capture through the reactions n +10 B →7 Li + α + γ (94% B.R.) and n +10 B →7 Li + α (6% B.R.) [26]. The products of these reactions lead to an increased single event upsets (SEUs) rate in configuration memory with respect to other FPGAs produced by means of Boron-free technological processes
Summary
O N-DETECTOR digital electronics in High-Energy Physics (HEP) experiments is increasingly being implemented by means of Static Random Access Memory-based (SRAM-based) Field Programmable Gate Arrays (FPGAs) [1]. Novel scrubbing techniques based on redundancy of configuration frames in a single device have been proposed [12]–[16]. These techniques require to generate redundant configuration frames in the device and to provide circuits to majority vote frames for data detection and correction. We describe a scrubber implementation dedicated to data acquisitions systems and based on majority voting of configuration frames across clustered non-redundant modules. Similar approaches are being evaluated for telecommunications in space in order to build reliable systems based on commercial off-the-shelf (COTS) components [21]
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