Abstract
The characteristics of sub-micron scale crystalline–crystalline interface roughness in CuInSe 2 thin films have been studied using transmission electron microscopy. The interface is formed by local recrystallization of CuInSe 2 films using electron beam irradiation in a transmission electron microscope. Analysis of the interface data obtained from the electron micrographs suggested that the interface shows self-affine fractal scaling with a static scaling exponent of 0.97±0.02.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
