FPGA Based Characterization of Thin Film For Guided Mode Resonance Devices Utilizing Layer-By-Layer Deposition of Nano-Particles

Abstract

Optical sensors are extensively used in different fields of engineering. Multilayer thin film manufactured utilizing the Layer-by-Layer self-assembly method has obtained many applications such as mass sensors, smoke sensors, ammonia gas sensors, membranes. At the time of synthesis, in-situ monitoring of film growth, as well as precise control of film thickness, are of excellent significance for various applications. The deposition rate and film density are two of the various parameters that determine the nature of the accumulated film. On-line monitoring of thin-film thickness has been enhanced as an inherent part for thin-film formation with wanted features. This works aims to develop a convenient simulation method to determine the thickness of the film based upon optical signal processing using FPGA and Verilog HDL.