Abstract
AbstractFourier transform photocurrent spectroscopy (FTPS) is used as an inspection method for hydrogenated amorphous silicon (a‐Si:H) thin films deposited on aluminium foil and aluminium foil coated with rough SnO2. These structures are part of roll‐to‐roll solar cell fabrication process. Measurement technique utilizes transparent electrode in a sandwich arrangement. An elaborate calculation procedure is used to correct the measurement for the optical effects in order to obtain spectra of optical absorption coefficient. Correction procedure is based partly on analytical formulae and partly on Monte‐Carlo simulations. Quality of thin a‐Si:H layers deposited by PECVD on glass and aluminium foil with and without rough layer of SnO2 were compared. Positive effect of aluminium and SnO2 on layer quality and effect of bandgap shift was observed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
