Abstract
Optical properties and optical constants of thin solid films of TiNx and SnOx were investigated by means of both Fourier transform IR spectrometry and very sensitive surface electromagnetic wave phase spectrometry. Layers of TiNx have low reflectance over the UV and visible spectral regions and high reflectance in the thermal IR region. Films of partially oxidized tin, SnOx, lead to a relatively narrow low reflectance peak in the “reststrahlen” band of the crystalline quartz, which overlaps some of the CO2 laser lines. Hence both kinds of films can be used to increase the sensitivity of radiometers made on the basis of quartz resonators.
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