Abstract
Optical properties and optical constants of thin solid films of TiN x and SnO x were investigated by means of both Fourier transform IR spectrometry and very sensitive surface electromagnetic wave phase spectrometry. Layers of TiN x have low reflectance over the UV and visible spectral regions and high reflectance in the thermal IR region. Films of partially oxidized tin, SnO x , lead to a relatively narrow low reflectance peak in the “reststrahlen” band of the crystalline quartz, which overlaps some of the CO 2 laser lines. Hence both kinds of films can be used to increase the sensitivity of radiometers made on the basis of quartz resonators.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
