Abstract
We have investigated availability of fast ion beams for observing the forward scattering effect of Auger electrons emitted from a crystal surface. The angle-resolved patterns of Si KLL–Auger electrons (∼1.6 keV) induced by 12 MeV He 2+ exhibited clear crystallographic symmetry including enhanced intensities in the 〈1 0 0〉 and 〈1 1 1〉 directions. The results demonstrate applicability of the angle-resolved spectroscopy of ion-induced Auger electrons to structural analysis of surfaces and interfaces.
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