Abstract

The microstructure and texture of the cold rolled oriented electrical steel with 3% Si after annealing at various temperatures were characterized by means of electron backscattering diffraction (EBSD), scanning electron microscope (SEM) and X-ray diffractmeter (XRD). It was found that the preferential nucleation sites are shear bands and the deformed grain boundaries at the early stage of the recrystallization. But the nuclei at the shear bands became to the dominated recrystallized grains with annealing. According to the experimental data and calculation results using misorientation principle, the misorientation between recrystallized grains and the surrounded deformed matrix was mainly distributed in the range between 25 and 45°. High stored energy of the deformed γ-fiber components results in preferred recrystallization at the beginning of recrystallization. The recrystallized grains oriented with {111}<110> and {111}<112> maintain prominent from beginning to the end of the recrystallization. The proportion of sporadical Goss recrystallized grains is low after completion of the recrystallization. But the misorientation between Goss grains and the surrounded grains is based on the high angles ranging from 25 to 45°.

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