Abstract
Perfect crystals in transmission (Laue) geometry can effectively be used for x-ray monochromators. Perfect Laue crystals show an interesting focusing effect when the incident beam is white and divergent. This focusing is highly dependent on the beam divergence and on the energy bandpass of the crystal. The aim of this work is to study whether this property can be used for focusing a synchrotron x-ray beam, and to obtain quantitatively the beam dimensions of the resulting monochromatic beam. We have experimentally measured the size of an undulator beam after diffraction from a diamond crystal in Laue geometry, and we analyzed and explained the results by comparison with ray tracing.
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