Abstract
Perfect crystals in transmission (Laue) geometry can be used effectively for x-ray monochromators, and moreover, perfect Laue crystals show an interesting focusing effect when the incident beam is white and divergent. This focusing is directly dependent on the incident beam divergence and on the diffraction profile width of the crystal. The aim of this work is to study whether this property can be used for focusing a synchrotron x-ray beam, and to obtain quantitatively the dimensions of the resulting monochromatic beam. We have experimentally measured the size of an undulator beam after diffraction from a diamond crystal in Laue geometry, and we analyze and explain the results by comparison with ray-tracing simulations.
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