Abstract
Two Focused Ion Beam based transmission electron microscopy (TEM) thin film preparation techniques are introduced. One is dedicated to the preparation of single fibres, the other to fibre/matrix interfaces of fibre reinforced composites. Due to their thin film quality, reliability and predictable processing times both techniques are suited for routine applications in material science like TEM studies of fibre microtextures and fibre/matrix interfaces. Exemplarily they are applied to Carbon Fibres and Carbon Fibre reinforced Carbon Matrix Composites (C/C). The achieved preparation standard in both cases is substantiated by TEM investigations.
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