Abstract
An ion source of high intensity is described in which the ions are produced by bombarding a region of gas by a focused beam of electrons. This ion source is universal in that it may be used with any gas that may be ionized by electron impact. A theoretical expression for the emission from the ring-shaped cathode used in this source is given, and the emission vs. voltage curve calculated from this expression is compared with experimental emission curves. Electron beams as intense as 2.2 amp./${\mathrm{cm}}^{2}$ are reported. Curves of total ion yield from the source plotted against (1) electron emission (2) electron energy (3) pressure are presented. Hydrogen ion beams of four ma are reported. The difficulty of focusing an ion beam of high intensity is discussed. A mass spectroscopic analysis of hydrogen and helium ion beams is presented. The proton yields vary from five percent to 80 percent of the total hydrogen ion beam and are seen to be a function of pressure, electron energy, and electron emission. The ${\mathrm{He}}^{++}$ yield in the helium ion beam is of the order of five percent of the total beam current.
Published Version
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