Abstract
This poster describes recent advances in fly height (FH) measurement technology for rigid disk drives. Such advances have become necessary as fly heights (i.e. the spacing between the head and the disk in a rigid disk drive) drop below 10 nm, giving rise to new measurement challenges, especially in the area of slider calibration. New algorithms have been developed that enable accurate measurements (95% confidence int. /spl sim/1 nm) with low one sigma (/spl sim/0.5 nm) at low fly heights (mean FH /spl sim/9 nm).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
