Abstract
Focused ion-beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs(superconducting quantum interference devices) which incorporate resistively shuntedmicrobridge junctions and a central loop with a hole diameter ranging from 1058 to 50 nm.The smallest device, with a 50 nm hole diameter, has a white flux noise level of2.6 µΦ0 Hz−1/2 at104 Hz. The scaling of the flux noise properties and focusing effect of the SQUID with the holesize were examined. The observed low frequency flux noises of different devices werecompared with the contribution due to the spin fluctuation of defects introduced duringFIB processing and of thermally activated flux hopping in the SQUID washer.
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