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Abstract
Self-field induced flux creep has been studied in YBa 2 Cu 3 O 7− y thin films in zero external field at temperatures below T c . Self-field induced flux creep model, which is the extension of Anderson and Kim conventional flux creep model has been introduced. The verification of the model has been done by performing voltagecurrent measurements on patterned YBa 2 Cu 3 O 7− y thin films. The variation of pinning potential, u 0 , as function of temperature is obtained.
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