Fluoride ion field emission from a ZBLAC glass emitter

Abstract

F− ion conducting 60ZrF4·30BaF2·LaF3·2AlF3·7CsF (mol%) with outer mol% of xIn2O3 (x = 0, 5, 10) glasses were prepared using a conventional melting method, and structure and glass transition behavior were investigated using X-ray diffraction (XRD), differential scanning calorimetry (DSC) and Raman spectroscopy. Impedance measurement reveals the glass with x = 10 shows F− ion conductivity of 5 × 10−6 S/cm at 200 °C. F− ion emission measurement was carried out for the first time using a sharpened glass tip, and the emission current was observed above the acceleration voltage of 2.5 kV at 200 °C and 1 × 10−4 Pa. After the F− emission measurement, fluorine was detected on a Cu target substrate by using an energy-dispersive X-ray spectrometer. However, a small amount of glass component was also detected on the target substrate, suggesting the glass tip may also decompose. A good linear correlation is obtained between log(current) and the square root of the voltage, suggesting the emission current of F− ion from the tip of glass is expressed by Schottky model.