Abstract
Fluorescence lifetime imaging is combined with atomic force microscopy in an integrated scanning microscope using a silicon-nitride probe. The time decay of fluorescence is measured at each image position with a resolution of 50 ps by time correlated single photon counting using a frequency doubled mode-locked Ti-Sapphire laser and fast electronics. Images of a mixture of fluorescence labelled latex spheres are presented where the lifetime contrast of the different spheres can be directly correlated to the topography as detected by force microscopy.
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