Abstract
The fluctuation model with Gaussian-type of barrier heights distribution that was recently applied successfully to explain the dark current–voltage characteristics of Au/GaAs barrier structure with microrelief interface, in this paper is extended to photoelectric characteristics. In addition to the change of the Richardson constant and the apparent temperature coefficient of barrier height we predict the decrease of the open-circuit voltage of photodetectors or solar cells. The theoretical predictions have been verified experimentally on the Au/GaAs Schottky barriers with dendrite-like or quasigrating interface prepared by wet anisotropic etching.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.