Abstract

We present a calibration flow for a large-scale Floating-Gate (FG) System-on-Chip (SoC) Field Programmable Analog Array (FPAA) to enable analog system design and built-in self test. We focus on calibration of the FG programming infrastructure, Digital-Analog Converters (DAC) and Analog-Digital Converters (ADC), as well as characterization of hot-electron injection parameters. This paper shows the results of a compiled Winner-Take-All (WTA) circuit on three different calibrated chips.

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