Abstract

The unclear physical origin of flicker noise in ultra-stable quartz oscillators is still limiting some practical metrological applications. In this paper, we study experimentally the possible correlations between Q-factor measurements at low temperature (4[Formula: see text]K) and the level of flicker noise at nominal operating temperature (353[Formula: see text]K). Results for 10 Stress-Compensated-cut (SC-cut) resonators with a 5[Formula: see text]MHz resonant frequency and different noise levels (some excellent) are presented and commented, for several overtones and anharmonic modes.

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