Flexible resistive switching device based on air-stable lead-free Cu3SbI6 perovskite film for nonvolatile memory application

Abstract

Resistive switching (RS) behavior of lead-free rudorffite perovskite Cu3SbI6 is explored for developing high performance flexible resistive switching random access memory (ReRAM) devices. The Cu3SbI6 based devices exhibit reproducible bipolar nonvolatile RS behaviors with low operating voltage (≤±0.6 V), stable endurance (≥400 cycles), and long data retention time (≥104 s). Moreover, the devices fabricated on flexible substrates show good electrical reliability and mechanical stability under different bending angles and consecutive bending cycles (103 times). A computational study method is used to reveal the mechanical stability of the Cu3SbI6 and the RS properties of the memory devices. More importantly, the Cu3SbI6 based devices exhibit no significant changes in RS behaviors after stored in ambient conditions for over 60 days. The results suggest that devices based on all-inorganic lead-free rudorffite perovskite materials have great potential for high performance, stable, and flexible ReRAM.