Abstract
A retarding field display analyzer, similar to that used in LEED, is discussed. It uses four retarding field grids and projects the electron distribution onto a hemispherical phosphor screen. However, this analyzer has no coaxial electron gun, which permits measurements of electron intensity over a large angular range. A fiber-optic faceplate projects the hemispherical image onto a plane, where the light intensity is measured ex situ with a high dynamic range CCD camera. This analyzer is optimized for angle-resolved Auger and photoemission spectroscopy. We evaluate the effectiveness of this analyzer for the measurement of angle-resolved diffraction patterns for use in electron holography.
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