First principles inelastic mean free paths coupled with Monte Carlo simulation of secondary electron yield of Cu-Ni, Cu-Zn, and Mo-Li

Abstract

Secondary electron yield (SEY) is relevant for widely used characterization methods (e.g., secondary electron spectroscopy and electron microscopy) and materials applications (e.g., multipactor effect). Key quantities necessary for understanding the physics of electron transport in materials and simulation of SEY are electron mean free paths (MFPs). This paper explores the impact of alloying on MFPs and SEY for Cu-Ni, Cu-Zn, and Mo-Li alloys relative to their component metals Cu, Ni, Zn, Mo, and Li. Density functional theory calculations yield density of states, Fermi energy, work function, and frequency- and momentum-dependent energy loss function. These material properties were used to calculate MFPs and Monte Carlo simulations were performed to obtain energy dependent SEY for the alloys as well for the component metals. The results show that MFPs and SEYs of the studied alloys lie between those of component pure elements but are not a simple composition weighted average. Detailed analysis of the secondary electron generation and emission process shows that the changes in the SEY of alloys relative to the SEY of their component metals depend on the changes in both electronic structure and dielectric properties of the material.