Abstract
In this work we investigated the performance of Single-Walled Boron Nitride Nanotube (SWBNNT) sandwiched between CrO2 based Magnetic Tunnel Junction (MTJ) structures with atomistic simulations. MTJ based device-level simulation was performed using the Extended Huckel based Tight Binding (EHTB) model. The SWBNNT as a dielectric layer and CrO2 as Ferromagnetic (FM) layers based Magnetic Tunnel Junction (MTJ) heterostructure was computed. The proposed MTJ device operates at the nano-Ampere (nA) range depicting its potential application in a low-powered nanoelectronics device. It also shows a promising Tunnel Magnetoresistance (TMR) effect. The practical circuit-level implementation of the proposed MTJ device in Magnetic Random-Access Memory (MRAM) was validated using LTspice. Hence, the calculated static power consumption and writing energy per bit was minimal for S1 and S2 based MRAM circuit. The perfect switching operation was depicted by the proposed MTJ device based MRAM.
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