Abstract
In this study three-dimensional finite analysis models of 3D micro-scale chip scale package (CSP) solder joints were set up. The stress-strain distribution of micro-scale CSP solder joints was obtained by finite element analysis under the condition of random vibration load. The influence of different solder, pad diameter and solder joint volume on the stress-strain of micro-scale CSP solder joint was analyzed. The results show that the maximum equivalent stress of SAC387 is the largest in SAC305, SAC387, 63Sn37Pb and 62Sn36Pb2Ag four kinds of solder joint materials under random vibration condition. When the maximum diameter of the joint is reduced from 0.105mm to 0.085mm, the stress and strain in the micro-scale CSP solder joint show an increasing trend. When the diameter of the pad is reduced from 0.09mm to 0.06mm, the stress and strain in the micro-scale solder joint show an increasing trend.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.