Abstract
We examined the film-thickness dependence on the microwave properties and microstructure of c-axis oriented YBCO films with thickness up to approaximately 1 μm on MgO(100) substrates by pulsed laser deposition, using different growth conditions. The surface roughness that was caused by Cu compound outgrowths allowed misoriented grains to form in the thicker films resulting in higher resistance Rs. By lowering growth rate, the thick films with higher orientation were obtained, and exhibited lower Rs and unloaded Q of 8E+4 at 70 K in a 2 GHz microstrip line resonator.
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